Reum, Alexander : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (25)
Les plus populaires
Liste
- Liste
- Tableau

1

Advanced electric-field scanning probe lithography on molecular resist using active cantilever

Kaestner, Marcus, Aydogan, Cemal, Ivanov, Tzvetan, Ahmad, Ahmad, Angelov, Tihomir, Reum, Alexander, Ishchuk, Valentyn, Krivoshapkina, Yana, Hofer, Manuel, Lenk, Steve, Atanasov, Ivaylo, Holz, Mathias,

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Année:

2015

Langue:

english

Fichier:

PDF, 12.78 MB

english, 2015

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Alternative Lithographic Technologies VI - Electric field scanning probe lithography on molecular glass resists using self-actuating, self-sensing cantilever

Resnick, Douglas J., Bencher, Christopher, Kaestner, Marcus, Nieradka, Konrad, Ivanov, Tzvetan, Lenk, Steve, Krivoshapkina, Yana, Ahmad, Ahmad, Angelov, Tihomir, Guliyev, Elshad, Reum, Alexander, Budd

Année:

2014

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2014

3

High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint lithography technology

Lenk, Claudia, Krivoshapkina, Yana, Hofmann, Martin, Lenk, Steve, Ivanov, Tzvetan, Rangelow, Ivo W., Ahmad, Ahmad, Reum, Alexander, Holz, Mathias, Glinsner, Thomas, Eibelhuber, Martin, Treiblmayr, Dom

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2019

Langue:

english

Fichier:

PDF, 5.69 MB

english, 2019

4

Field-emission scanning probe lithography tool for 150 mm wafer

Holz, Mathias, Guliyev, Elshad, Ahmad, Ahmad, Ivanov, Tzvetan, Reum, Alexander, Hofmann, Martin, Lenk, Claudia, Kaestner, Marcus, Reuter, Christoph, Lenk, Steve, Rangelow, Ivo W., Nikolov, Nikolay

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2018

Langue:

english

Fichier:

PDF, 7.39 MB

english, 2018

5

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Alternative Lithographic Technologies VII - Advanced electric-field scanning probe lithography on molecular resist using active cantilever

Resnick, Douglas J., Bencher, Christopher, Kaestner, Marcus, Aydogan, Cemal, Lipowicz, Hubert-Seweryn, Ivanov, Tzvetan, Lenk, Steve, Ahmad, Ahmad, Angelov, Tihomir, Reum, Alexander, Ishchuk, Valentyn,

Année:

2015

Langue:

english

Fichier:

PDF, 3.79 MB

english, 2015

6

Large area fast-AFM scanning with active “Quattro” cantilever arrays

Ahmad, Ahmad, Nikolov, Nikolay, Angelov, Tihomir, Ivanov, Tzvetan, Reum, Alexander, Atanasov, Ivaylo, Guliyev, Elshad, Ishchuk, Valentyn, Kaestner, Marcus, Krivoshapkina, Yana, Lenk, Steve, Lenk, Clau

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2016

Langue:

english

Fichier:

PDF, 5.40 MB

english, 2016

7

Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithography

Angelov, Tihomir, Ahmad, Ahmad, Guliyev, Elshad, Reum, Alexander, Atanasov, Ivaylo, Ivanov, Tzvetan, Ishchuk, Valentyn, Kaestner, Marcus, Krivoshapkina, Yana, Lenk, Steve, Lenk, Claudia, Rangelow, Ivo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2016

Langue:

english

Fichier:

PDF, 2.53 MB

english, 2016

8

Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication

Rangelow, Ivo W., Ivanov, Tzvetan, Ahmad, Ahmad, Kaestner, Marcus, Lenk, Claudia, Bozchalooi, Iman S., Xia, Fangzhou, Youcef-Toumi, Kamal, Holz, Mathias, Reum, Alexander

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2017

Langue:

english

Fichier:

PDF, 5.07 MB

english, 2017

9

Nanofabrication by field-emission scanning probe lithography and cryogenic plasma etching

Lenk, Claudia, Hofmann, Martin, Lenk, Steve, Kaestner, Marcus, Ivanov, Tzvetan, Krivoshapkina, Yana, Nechepurenko, Diana, Volland, Burkhard, Holz, Mathias, Ahmad, Ahmad, Reum, Alexander, Wang, Chen, J

Journal:

Microelectronic Engineering

Année:

2018

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2018

10

Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy

Rangelow, Ivo W., Kaestner, Marcus, Ivanov, Tzvetan, Ahmad, Ahmad, Lenk, Steve, Lenk, Claudia, Guliyev, Elshad, Reum, Alexander, Hofmann, Martin, Reuter, Christoph, Holz, Mathias

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2018

Langue:

english

Fichier:

PDF, 3.58 MB

english, 2018

11

Expanding current distribution measurement in PEFCs to sub-millimeter resolution

Stefan A. Freunberger, Mathias Reum, Alexander Wokaun, Felix N. Büchi

Journal:

Electrochemistry Communications

Année:

2006

Langue:

english

Fichier:

PDF, 136 KB

english, 2006

12

Measuring the Current Distribution with Sub-Millimeter Resolution in PEFCs

Reum, Mathias, Freunberger, Stefan A., Wokaun, Alexander, Büchi, Felix N.

Journal:

Journal of The Electrochemical Society

Année:

2009

Langue:

english

Fichier:

PDF, 431 KB

english, 2009

13

Measuring the Current Distribution in PEFCs with Sub-Millimeter Resolution

Freunberger, Stefan A., Reum, Mathias, Evertz, Jörg, Wokaun, Alexander, Büchi, Felix N.

Journal:

Journal of The Electrochemical Society

Année:

2006

Langue:

english

Fichier:

PDF, 713 KB

english, 2006

14

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Self-actuated, self-sensing cantilever for fast CD measurement

Cain, Jason P., Sanchez, Martha I., Ahmad, Ahmad, Ivanov, Tzvetan, Reum, Alexander, Guliyev, Elshad, Angelov, Tihomir, Schuh, Andreas, Kaestner, Marcus, Atanasov, Ivaylo, Hofer, Manuel, Holz, Mathias,

Année:

2015

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2015

15

Adapted Flow Field Structures for PEFC

Reum, Mathias, Wokaun, Alexander, Büchi, Felix N.

Journal:

Journal of The Electrochemical Society

Année:

2010

Langue:

english

Fichier:

PDF, 331 KB

english, 2010

16

Measuring the Current Distribution with Submillimeter Resolution in PEFCs

Reum, Mathias, Wokaun, Alexander, Büchi, Felix N.

Journal:

Journal of The Electrochemical Society

Année:

2009

Langue:

english

Fichier:

PDF, 250 KB

english, 2009

17

Selective Antimicrobial Activity Associated with Sulfur Nanoparticles

Schneider, Thomas, Baldauf, Alexander, Ba, Lalla A., Jamier, Vincent, Khairan, Khairan, Sarakbi, Mohammed-Bader, Reum, Nico, Schneider, Marc, Röseler, Anne, Becker, Katja, Burkholz, Torsten, Winyard,

Journal:

Journal of Biomedical Nanotechnology

Année:

2011

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2011

18

Scanning probe-based high-accuracy overlay alignment concept for lithography applications

Ishchuk, Valentyn, Guliyev, Elshad, Aydogan, Cemal, Buliev, Ivan, Kaestner, Marcus, Ivanov, Tzvetan, Ahmad, Ahmad, Reum, Alexander, Lenk, Steve, Lenk, Claudia, Nikolov, Nikolay, Glinsner, Thomas, Rang

Journal:

Applied Physics A: Materials Science & Processing

Année:

2017

Langue:

english

Fichier:

PDF, 10.05 MB

english, 2017

19

Acute inflammation reveals GABA A receptor‐mediated nociception in mouse dorsal root ganglion neurons via PGE 2 receptor 4 signaling

Jang, In Jeong, Davies, Alexander J., Akimoto, Nozomi, Back, Seung Keun, Lee, Pa Reum, Na, Heung Sik, Furue, Hidemasa, Jung, Sung Jun, Kim, Yong Ho, Oh, Seog Bae

Journal:

Physiological Reports

Année:

2017

Langue:

english

Fichier:

PDF, 590 KB

english, 2017

20

Tropospheric jet response to Antarctic ozone depletion: An update with Chemistry-Climate Model Initiative (CCMI) models

Son, Seok-Woo, Han, Bo-Reum, Garfinkel, Chaim I, Kim, Seo-Yeon, Park, Rokjin, Abraham, N Luke, Akiyoshi, Hideharu, Archibald, Alexander T, Butchart, N, Chipperfield, Martyn P, Dameris, Martin, Deushi,

Journal:

Environmental Research Letters

Année:

2018

Langue:

english

Fichier:

PDF, 2.76 MB

english, 2018

21

Field emission from diamond nanotips for scanning probe lithography

Hofmann, Martin, Lenk, Claudia, Ivanov, Tzvetan, Rangelow, Ivo W., Reum, Alexander, Ahmad, Ahmad, Holz, Mathias, Manske, Eberhard

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2018

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2018

22

Sharp GaN nanowires used as field emitter on active cantilevers for scanning probe lithography

Lenk, Claudia, Hofmann, Martin, Ivanov, Tzvetan, Ahmad, Ahmad, Lenk, Steve, Rangelow, Ivo W., Reum, Alexander, Reuter, Christoph, Holz, Mathias, Behzadirad, Mahmoud, Rishinaramangalam, Ashwin K., Feez

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2018

Langue:

english

Fichier:

PDF, 1.45 MB

english, 2018

23

An Integrated in SEM Multi-Purpose AFM Instrument Utilizing an Active Cantilever

Holz, Mathias, Reum, Alexander, Ahmad, Ahmad, Ivanov, Tzvetan, Reuter, Christoph, Hofmann, Martin, Rangelow, Ivo W.

Journal:

Microscopy and Microanalysis

Année:

2019

Langue:

english

Fichier:

PDF, 848 KB

english, 2019

24

Tip-based electron beam induced deposition using active cantilevers

Holz, Mathias, Allen, Frances I., Reuter, Christoph, Ahmad, Ahmad, Hofmann, Martin, Reum, Alexander, Ivanov, Tzvetan, Rangelow, Ivo W.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2019

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2019

25

Field emission scanning probe lithography with GaN nanowires on active cantilevers

Behzadirad, Mahmoud, Rishinaramangalam, Ashwin K., Feezell, Daniel, Busani, Tito, Reuter, Christoph, Reum, Alexander, Holz, Mathias, Gotszalk, Teodor, Mechold, Stephan, Hofmann, Martin, Ahmad, Ahmad,

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2020

Fichier:

PDF, 3.65 MB

2020